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頁籤選單縮合
題 名 | 相同誤差下之多重檢驗最小成本模式=A Cost-Minimization Model for Multiple Inspections under Identical Errors |
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作 者 | 邱文智; | 書刊名 | 管理學報 |
卷 期 | 14:2 1997.06[民86.06] |
頁 次 | 頁287-303 |
分類號 | 494.568 |
關鍵詞 | 多重檢驗; 檢驗誤差; 平均出廠品質界限; Multiple inspections; Inspection error; AOQL; |
語 文 | 中文(Chinese) |
中文摘要 | 許多高科技高價值之產品不但應全數檢驗,而且每一產品均須經不只一次之檢驗 程序,此即稱為「多重檢驗」。如何在內部生產、檢驗及修復成本與外部失效成本之間,尋 求一個最佳均衡點,使每單位產品之平均總成本最低,乃成為本文之研究目的。本文在假設 檢驗者誤差相同的條件下, 導出多重檢驗的最小成本檢驗模式,分為 (1) 無平均出廠品質 界限 (2) 有平均出廠品質界限兩種情況。 每種情況可再依不良品是否可修復分成兩類不同 之模式,每一模式均經數學驗證,並以電腦程式測試之,以確保正確無誤。 |
英文摘要 | Most of high-tech high-value products must have a high quality level. They have several cycles of same inspection procedure, namely, "multiple inspections." How to keep a balance between internal cost and external failure cost has provided the motivation for this paper. This paper derived a cost-minimization model for the topic of multiple inspections under the condition of identical inspection errors, it includes two cases: (1) no average outgoing quality limit(AOQL)(2) with average outgoing quality limit. Every case can divide into two varieties of model depending on whether it is recovered from defects or not. All of the optimum models have been verified mathematically and run with computer programs correctly. |
本系統中英文摘要資訊取自各篇刊載內容。