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頁籤選單縮合
題 名 | Minimum Average Fraction Inspected for CSP-C-1 Plan=使平均檢驗率為最小的CSP-C-1計劃 |
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作 者 | 陳忠和; 王瑞琛; 周昭宇; | 書刊名 | 管理學報 |
卷 期 | 17:4 2000.12[民89.12] |
頁 次 | 頁677-693 |
分類號 | 494.568 |
關鍵詞 | 連續抽樣計劃; 平均檢驗率; 平均出廠品質; 平均出廠品質界限; Continuous sampling plan CSP-1; Average fraction inspected; AFI; Average outgoing quality; AOQ; Average outgoing quality limit; AOQL; |
語 文 | 英文(English) |
中文摘要 | Wang與Chang於1989年提出了限制檢驗能量的連續抽樣計劃(CSP-C-1), 此種抽樣針劃可提供產品相同的平均出廠品質界限,但不需要執行100的全數檢 驗。本研究將呈現進一步修正的Endres方法來求解使平均檢驗率為最小的CSP-C-1 計劃的問題。 |
英文摘要 | In 1989, Wang and Chang have proposed the continuous sampling plan CSP-1 under theconditioned inspection capacity, i.e., the CSP-C-1 plan. This kind of sampling plan provides the same averageoutgoing quality limit (AOQL) for product, and it does not have the 100 inspection restriction. In this paper, wepresent a further modification of Endres's method to construct the problem of minimizing the average fractioninspected (AFI) for a CSP-C-1 olan. |
本系統中英文摘要資訊取自各篇刊載內容。