查詢結果分析
來源資料
頁籤選單縮合
題 名 | 截斷半徑對銅奈米薄膜壓縮之影響研究=Study on Effect of Truncated Radius to Copper Nano-Scale Film under Compression |
---|---|
作 者 | 林有鎰; 吳邦彥; 李建德; | 書刊名 | 德霖學報 |
卷 期 | 24 2010.08[民99.08] |
頁 次 | 頁15-23 |
分類號 | 446.12 |
關鍵詞 | 分子動力學; 銅奈米薄膜; 比例壓縮; 截斷半徑; Molecular dynamics; Copper nano thin film; Proportional compression; Truncated radius; |
語 文 | 中文(Chinese) |
中文摘要 | 本文建立銅奈米薄膜壓縮實驗之分子動力學模式,探討截斷半徑對銅奈米薄膜承受比例壓縮 的影響,其中薄膜尺寸為14a0 × 6a0 × 6a0,a0 為晶格常數,原子總數為2016 個,壓縮速率為 -0.000002/步,系統溫度為293K。首先求出五種不同截斷半徑( rc =2.5、2.75、3.0、3.25、3.5)條件 下,自由移動區各原子位移和等效應變,其次代入原子級應力公式求出壓縮模擬的等效應力,最後 繪出流變應力-應變曲線。結果顯示當rc 愈大時,壓應力-壓應變曲線斜率愈小。 |
英文摘要 | In this paper, the simulation model of molecular dynamics for copper nano thin film under compression was established to investigate the effect of truncated radii. The atom size is 14a0 ×6a0 ×6a0 , and total 2016 atoms in the whole structure were used. First, the atomic displacement and equivalent strain in the free motion zone at five different truncated radii( rc =2.5、2.75、3.0、3.25、3.5) was found at -0.000002/step compressive rate and 293K system temperature . Then, equivalent stress could be calculated by using atomistic stress formula. Finally, flow stress-strain curve of copper nano thin film was plotted according to the stress-strain relationship. The result showed that the truncated radius is larger, the smaller the slope of stress-strain curve. |
本系統中英文摘要資訊取自各篇刊載內容。