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頁籤選單縮合
題 名 | Fault Diagnosis in Analog Circuits Using LabVIEW=類比電路之圖控自動診錯系統 |
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作 者 | 柯德祥; | 書刊名 | 中華技術學院學報 |
卷 期 | 23 2001.09[民90.09] |
頁 次 | 頁18-25 |
分類號 | 448.532 |
關鍵詞 | LabVIEW圖控軟體; 自動診錯; 參數估算法; 時域分析; 類比電路; LabVIEW; Fault diagnosis; Parameter estimation; Time domain analysis; Analog circuit; |
語 文 | 英文(English) |
中文摘要 | 本文以LabVIEW圖控軟體與參數估算法,對類比電路作自動化診錯研究,確保類比電路之功能正常與簡化故障之診斷維修。並以時域分析代替頻域分析,配合輸入訊號為步階函數,大量減少測試之資料擷取、時間與成本。配合功能測試,選取適當測試點與加入額外已知測試元件,增加其可測性,快速計算出參數值。本文以LabVIEW圖控軟體撰寫程式,實際執行類比電路之診錯,大量縮短程式撰寫時間與大幅減少測試時間及成本。 |
英文摘要 | This paper presents the use of LabVIEW, a commercial virtual instrument software package, and a parameter estimation approach for fault diagnosis of analog circuits in the time domain. The aim is to use dynamic models to enable the estimation of all components of analog circuits that are influenced by faults. The algorithm reduces fault diagnosis time because it uses a step input based on time domain rather than other wave stimuli based on frequency domain. This method has been implemented by using LabVIEW software package to reduce the test program development time, the cost of test, and the time of test and example results are given for detection of faults in this case. |
本系統中英文摘要資訊取自各篇刊載內容。