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題名 | 表面粗度曲線量測及其對界面接觸參數的影響= |
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作者 | 洪政豪; 李建興; 藍木龍; |
期刊 | 國立虎尾技術學院學報 |
出版日期 | 20000300 |
卷期 | 3 2000.03[民89.03] |
頁次 | 頁151-158 |
分類號 | 446.1 |
語文 | chi |
關鍵詞 | 表面粗度曲線量測; 表面形貌; 探針; 粗度曲線; |
中文摘要 | 本文以表面形貌與探針之幾何關係,及粗度曲線之統計相關特性確立合理的取樣間距量測範圍,再探討此合理範圍內不同取樣間距對粗度參數與界面接觸參數之影響,實驗與理論的分析結果顯示;表面平均粗度、表面均方根粗度、斜度、承壓指數與波谷總含指數在任何磨損時間下,受取樣間距的影響甚小,但是後三者的取樣間距應小於前二者之取樣間距方有較穩定的數值。波峰均方根粗度與表面波峰數雖然隨著取樣間距的增加而減少,但是波峰均方根粗度對真實接觸面積比的影嚮幾可忽略不計,而表面波鋒數的減少卻增加真實接觸面積比,波鋒曲率半徑隨著取樣間距的增加或表面磨損的進行而增加,同時也造成真實接觸面積比的增加,曲率半徑是影響接觸面積最重要粗度參數,曲率半徑合理的取樣間距應遠小於各項粗度參數的取樣間距方有統計的比較意義。 |
英文摘要 | In this paper, according to geometry relation of the topography and stylus and the statistical property of roughness curve, the reasonable sampling intervals were selected to study its effects on roughness and contact parameters. The theoretical results and the observation of experiment show that the sampling interval play a negligible role in average roughness, root mean square roughness, skewness, bearing index and total valley fluid retention index. The value of asperity root mean square roughness and numbers of peak decrease with increase in the sampling interval, and the reduction of numbers of peak produce an increment of real contact area ratio. An increase in sampling interval and wear time lead to an increase in asperity radius of curvature and real contact area ratio. Asperity radius of curvature is the most important roughness parameters affecting contact property in digital analysis. The results suggest that the sampling interval is much small than correlation distance in order to get the statistical characterisitics. |
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