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頁籤選單縮合
題名 | Degradation Analysis and Related Topics:Some Thoughts and a Review=衰變分析及相關問題:一些想法和回顧 |
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作者 | 趙民德; Chao, Min-te; |
期刊 | Proceedings of the National Science Council : Part A, Physical Science and Engineering |
出版日期 | 19990900 |
卷期 | 23:5 1999.09[民88.09] |
頁次 | 頁555-566 |
分類號 | 319.54 |
語文 | eng |
關鍵詞 | 衰變分析; 統計推論; 長成曲線; S-型曲線; 外插實驗設計; 隨機過程模型; 逐步應力模型; Accelerated life testing; Degradation; Design of experiments; Growth curve; S-shaped curves; Step-stress models; |
英文摘要 | Degradation is a phenomenon where certain measurements of quality characteristics deteriorate over time. When an item subject to life testing is too well made to fail, we often turn our attention to degradation measurements and hope to obtain life time information from this type of data. The first part of this paper presents a general discussion of the degradation phenomenon. The second part reviews some scattered works related to the analysis. Topics involve shelf life studies, growth curve, S-shaped curves, experimental design, stochastic process modeling, accelerated life testing and step-stress models. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。