頁籤選單縮合
題名 | 高分子厚膜電阻變異參數及可靠度=Variable Parameters and Stability of PTF Resistors |
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作者姓名(中文) | 王文谷; | 書刊名 | 化工資訊月刊 |
卷期 | 13:1 1999.01[民88.01] |
頁次 | 頁63-70 |
分類號 | 448.533 |
關鍵詞 | 電阻值; 高分子厚膜電阻; |
語文 | 中文(Chinese) |
中文摘要 | 高分子厚膜技術之特色為可製造多種不同的被動元件,在這些被動元 件中,電阻是用量最大也是最先被商業化的產品。但要精確控制一電阻值則存 在太多的變數,如製程變異與設計變異,因此必須使用科學方法來了解這些變 異參數,進而控制變異參數,才可獲得精確之電阻值。 |
英文摘要 | PTF technology can produce a variety of electrical components. In these PTF components, printed resistors are the first printed PTF products to be developed and commecialized. During prototype evaluation, the difference between process variables and design must be distinguished. Otherwise, the production team may encounter a formidable task when a prototype is released for manufacturing with a myriad of variables to control. In this article, we demonstrate the science behind the manufacture of PTF resistors. Results presented herein provide further insight into the methodology used to evaluate and control the PTF resistor manufacturing process. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。