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題 名 | On the Searching Patterns for Backward-Type Sequential Circuit Test Generation=逆向型序向電路測試圖樣產生法之策略研究 |
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作 者 | 梁新聰; | 書刊名 | 萬能學報 |
卷 期 | 20 1998.07[民87.07] |
頁 次 | 頁315+317-337 |
分類號 | 448.532 |
關鍵詞 | 錯誤模擬; 序向電路; Test generation; Sequential circuits; Test patterns; Fault simulation; |
語 文 | 英文(English) |
英文摘要 | This paper proposes strategies to help search patterns for sequential circuit test generation using the backward line justification method. The proposed strategies, such as the controllability calculation, drivability calculation, relation information, backtrack reduction, and invalid states searching, are discussed and used to implement a backward-type test generator. Incorporating with a fault simulator - SEESIM to drop the detected faults, the test generator is applied for the ISCAS'89 benchmark circuits to show its efficiency in generating test sequences or identifying untestable faults for sequential circuits. |
本系統中英文摘要資訊取自各篇刊載內容。