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題 名 | 最適壽命測試方法之探討=On the Optimal Life Testing Schedule |
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作 者 | 黃提源; 陳錦惠; | 書刊名 | 中國統計學報 |
卷 期 | 35:2 1997.06[民86.06] |
頁 次 | 頁161-172 |
分類號 | 448.57 |
關鍵詞 | 最適壽命測試; 指數分配; 韋伯分配; Optimal life testing; Exponential distribution; Weibull distribution; |
語 文 | 中文(Chinese) |
中文摘要 | 這篇論文所探討的內容分成三部份。第一部份是研究I種(I>1)產品的期望測試時 間。 我們假設產品的壽命具指數分配, 且各種產品最多可同時測試 N 個, 則在更換測試 (replacement test) 過程之下, 我們發現逐次測試方法比同時測試方法或結合同時和逐次 測試的混合測試方法所需的期望測試時間較短。第二部份,我們引起成本概念,以決定最佳 測試器個數,使等候測試時間成本和產品成本的期望總成本為最小。第三部份,假設產品壽 命具韋伯 (Weibull) 分配,在非更換測試過程之情況下, 當 I=2,給與各種參數實際值, 我們發現逐次測試方法比同時測試方法所需時間較短。 |
英文摘要 | In this paper, our research is divided into three parts. The first part is to study the problem of estimating the mean life of I types of manufacturing products (I>1). Assuming that the lifetime distribution of the manufacturing products is exponential and at most N manufacturing products can be tested concurrently, we find under the replacement test procedure that the sequential test requires smaller mean testing time than those of the concurrent test and the combined concurrent and sequential test. The second part is to determine the optimal number of testers which minimizes the expected total system cost including the cost of waiting time and the cost of manufacturing products. The last part is to extend te lifetime distribution of the manufacturing products to Weibull distribution, and the nonreplacement procedure test is applied to estimate the mean life of each type of manufacturing products. The fact that the sequential test requires smaller mean testing time than that of the concurrent test is found when I is equal to two for various given parameter values. |
本系統中英文摘要資訊取自各篇刊載內容。