查詢結果分析
來源資料
頁籤選單縮合
題 名 | Preparation of Submicron Speckles for Microdeformation Analysis=次微米散斑之製備技術及其在微變形分析之應用 |
---|---|
作 者 | 翁炳志; 張順太; | 書刊名 | 材料科學 |
卷 期 | 24:1 1992.03[民81.03] |
頁 次 | 頁53-65 |
分類號 | 440.2 |
關鍵詞 | 次微米; 散斑; 製備; 技術; 微變形分析; |
語 文 | 英文(English) |
中文摘要 | 結合掃描式電子顯微鏡和雷射散斑干涉技術以量測材料受力時的微細 變形之散斑電子顯微鏡法的有效利用,主要繫於所形成之散斑的品質。本文發現 利用離心分離技術,可成功地將微細的0.05μm氧化鋁粉末沈積均勻於材料表面 上,而製造出品質良好之次微米的散斑圖。使用掃描式電子顯微鏡連續的記錄材 料在不同變形量時的散斑圖於底片上。由此記錄之散斑圖,再藉由雷射光束的分 析能定量以量測出材料微細變形量。本研究,我們成功的製造出次微米散斑圖, 使散斑電子顯微鏡技術在量測顯微變形的困難得到基本解決,此法可顯著提高散 斑法量測微細變形的靈敏度。利用此方法量測沃斯回火球墨鑄鐵受外力時的微變 形量已在本文中被證明。 |
英文摘要 | The combination of scanning electron microscope (SEM) and laser speckles interferometry technique, so called speckle SEM, was used to measure the micro deformation of materials during loading. With a centrifugal process, a well dispersed fine ceramic of 0.05 μm alumina paniculate was successfully deposited on to the specimen surface. The speckle pattern thus created was consecutively recorded by SEM at different stage of deformation. Degrees of deformation were analyzed quantitatively on recorded photographic film by laser beam. In this study, we succeed in creating the sub micron speckle pattern, an essence to the application of speckle SEM in micromechanics. The application of speckle SEM shows the sensitivity on displacement measurement as greatly enhanced. A demonstration of this technique on the micro deformation of austempered ductile iron is also presented. |
本系統中英文摘要資訊取自各篇刊載內容。