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來源資料
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題 名 | 金屬離子撞擊硫化鎘的熱刺激電流 |
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作 者 | 樂錦盛; | 書刊名 | 中原學報 |
卷 期 | 2 1973.10[民62.10] |
頁 次 | 頁51-53 |
關鍵詞 | 金屬離子; 硫化鎘; 電流; 熱刺激; |
語 文 | 中文(Chinese) |
英文摘要 | Thermally Stimulated Currents have been measured in the single crystal of CdS and the same crystal bombared with In ion. The traps with depths of 0.25 ev and 0.31 eV have appeared both in pure crystal on either E.W.C. method or E.L.T. method, and in bombarded crystal only on E.L.T. method. The 0.25 ev trap disappears when the bombarded crystal is on E.W.C. method, while one new trap appears with depth of 0.85 ev. |
本系統中英文摘要資訊取自各篇刊載內容。