頁籤選單縮合
題名 | Accelerating Acquisition Speed of 3D Scanners=三維掃描器擷取加速方法 |
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作者 | 温成; 黃志宏; 張光瓊; | 書刊名 | 龍華科技大學學報 |
卷期 | 32 2012.06 [民101.06] |
頁次 | 頁85-100 |
分類號 | 471.68 |
關鍵詞 | 二值化; 三維掃描器; 照射邊緣; 照射比; Binarization; 3D scanner; Illumination edge; Illumination ratio; |
語文 | 英文(English) |
中文摘要 | 結構光圖形照射後,所取得影像的二值化程序在二進制編碼分時多工結構光三維掃描器開發過程中,扮演重要的角色。實務上,常使用一組參考的結構光圖形來達成增加二值化程序演算的強健性。然而,這些額外增加使用的參考結構光圖形會降低結構光三維掃描器的擷取速度。因此,在開發二進制編碼分時多工結構光三維掃描器時,希望藉由減少參考結構光圖形使用以提升三維掃描器擷取速度的做法,與使用參考結構光圖形來增進三維掃描器的精確度與強健性,相互衝突。本論文應用所開發之基於照射比照設邊緣偵測技術,大幅提升結構光三維掃描器的擷取速度。 |
英文摘要 | Binarization of pattern-illuminated images plays an important role in developing a binary-coded time-multiplexing structured light 3D scanner. In practice, a set of inverse patterns should be projected to achieve a robust binarization process. However, these additional reference patterns will decelerate the 3D scanner’s acquisition speed. Thus, in developing a binary-coded time-multiplexing structured light 3D scanner, the desire for reduction of reference patterns in order to accelerate the 3D scanner’s acquisition speed is in conflict with the desire to adopt of reference patterns to improve the 3D scanner’s accuracy and robustness. In this paper, by applying our developed illumination ratio based illumination edge detection technique, the acquisition speed of a structured light 3D scanner is accelerated significantly. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。