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題名 | A Theoretical and Experimental Investigation into the EMI-induced Noise Spectrum of a BJT Amplifier=電晶體放大電路的電磁干擾感應頻譜的理論與實驗分析 |
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作 者 | 蔡漢彰; | 書刊名 | 正修學報 |
卷期 | 22 2009.11[民98.11] |
頁次 | 頁31-52 |
分類號 | 448.5 |
關鍵詞 | 雜訊; 諧波; 雙極性電晶體; 輻射功率; 導線; 電磁干擾; Noise; Harmonic wave; BJT; Radiated power; Conducting wire; EMI; |
語文 | 英文(English) |
中文摘要 | 本文爲電晶體放大電路的電磁干擾感應雜訊頻譜研究,其電磁干擾的理論推導模擬與實驗有完整的呈現,且結果顯示二者相當吻合。整個結果展示電磁干擾感應的雜訊與感應的脈波振幅,輸出負載,寄生電容與干擾訊號的振幅有關,而且當干擾訊號的振幅與頻率增加時諧波雜訊振幅跟隨增加。此論文誠提供了雜訊比與電磁干擾評估的好方法。 |
英文摘要 | This study investigates the low-frequency noise induced by electromagnetic interference (EMI) in a bipolar junction transistor (BJT) amplifier. Theoretical models of the EMI and the resulting noise spectrum are constructed and are validated experimentally. In general, a good agreement is observed between the two sets of results. Overall, the results indicate that the magnitude of the EMI-induced noise is determined primarily by the pulse height, the output load, the parasitic capacitance and the amplitude of the interference signal. Furthermore, it is shown that the harmonic noise increases with increasing interference amplitude and interference frequency. Moreover, this paper provides a convenient means of evaluating the EMI effects and signal-to-noise ratio (SNR) of BJTs. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。