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題 名 | 不同資料結構下異常作答指標決斷值的探討=A Study of Cutoffs for Aberrant Indices under Different Data Structures |
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作 者 | 黃財尉; | 書刊名 | 輔導與諮商學報 |
卷 期 | 30:1 2008.05[民97.05] |
頁 次 | 頁1-16 |
分類號 | 521.3 |
關鍵詞 | 異常指標; 內注意係數; 外注意係數; 決斷值; Aberrant indices; Within-ability-concern index (W*); Beyond-ability-surprise index (B*); Cutoffs; |
語 文 | 中文(Chinese) |
中文摘要 | 本研究的目的在建立高中低不同能力水準的受試群分別面對不同難度水準試題集時,內注意係數(Within-Ability Concern Index, W*)與外注意係數(Beyond-Ability Surprise Index, B*)指標達到顯著異常的標準,並考驗指標異常參照標準是否可適用於不同的資料分配。研究以虛擬資料產生九個資料矩陣,每個資料矩陣再產生500個排序結果,計算內外注意係數在此500個排序結果的第90百分位數,並重複20次,以其平均數作為最後的異常參照標準。研究結果發現: 一、指標於樣本矩陣上的分佈,大概主一倒Z字型分布,符合實際作答現象。 二、高能力者答錯其能力內試題的異常情形較答對能力外試題所引發的異常情形嚴重。 三、答對能力外試題所引發的可能訝異情形對低能力者而言比其答錯能力內試題的惋惜情境更加嚴重。 四、不同能力區間的內外注意係數指標之決斷標準值大體上有明顯差異,但能力區內面對不同難度水準的情況差異就不甚明顯,甚至低能力區內與中能力區內可以共用指標的決斷標準。 |
英文摘要 | Unexpected response patterns can provide substantial information for individual responses. Many aberrant indices were designed to detect examinees' aberrant response patterns. Two newly developed aberrance indices, the Within-Ability-Concern Index (W*) and the Beyond-Ability-Surprise Index (B*), were classified as the group-based index family and were applied to practical classrooms. The purpose of this study was to establish and examine the cutoffs of these two indices through a nonparametric test technique (permutation test) on different levels of individual ability and item difficulty. Nine simulated data matrices, including all combinations of high-median-low levels of ability and difficulty, were generated and permuted 500 times. The 90th percentiles of permutations in each ability-error-ratio cell were calculated and served as cutoffs for each index. After twenty repeats, an average of each index cutoff was used as a point of reference for the W* and B* indices, respectively. Findings showed that cutoffs of indices mapped by ability-difficulty matrices and ability-error-ratio cells from low to high showed a reverse Z-shape distribution. This was in line with real responses. As high achievers encounter different difficulty levels of items, they tend to have a high-score distribution. Low achievers tend to have a low-score distribution, and intermediate achievers tend to have an average distribution. Second, the high achievers were found to perform more aberrantly on their within-ability items than on their beyond-ability items. Third, the low achievers performed more aberrantly on their beyond-ability items than on their within-ability items. Fourth, the cutoffs of the two indices differed significantly between ability districts, but minimally different within each ability district. Finally, several tables and suggestions were also provided as the resolution of the issues. |
本系統中英文摘要資訊取自各篇刊載內容。