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題 名 | 應用廣義韋伯競爭失效模式於加速壽命試驗=A Generalized Weibull Competing Failure Mode Approach to Accelerated Life Test |
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作 者 | 沈盈志; 廖建義; | 書刊名 | 新新科技年刊 |
卷 期 | 3 2007.01[民96.01] |
頁 次 | 頁145-153 |
分類號 | 494.56 |
關鍵詞 | 競爭失效; 壽命分析; 加速壽命試驗; 可靠度; Competing failure; Life analysis; Accelerated life test; ALT; Reliability; |
語 文 | 中文(Chinese) |
中文摘要 | 本文提出一廣義韋伯(Weibull)競爭失效模式,各失效模式皆以四個參數描述。運用於加速壽命試驗之數據分析時,韋伯形狀參數及尺度參數皆為加速應力之函數,其可表現特徵壽命與應力之關係,亦能描述應力所造成的損傷記憶強度,更能掌握壽命分佈劣化行為,使壽命估計更準確。 研究結果顯示,操作負荷(加速應力)將影響壽命分佈形狀參數;而不同操作負荷下,其失效之改善優先度不同;當失效改善後,僅需直接移除已改善之失效模式,即能評估產品改善後之可靠度,可節省驗證成本,並縮短研發時程。 |
英文摘要 | This paper proposes a generalized Weibull competing failure mode approach that each failure mode is characterized by four parameters. While analyzing the data of accelerated life test, both scale and shape parameters and function of the accelerated stress. So, the life and degradation rate of each failure mode is altered with the varying stress, and this approach will improve the maximum likelihood estimation of life with less assumptions and more accurate. A case study shows that the varying stress will affect the shape parameter of life distribution, which was assumed to be invariant in several earlier references. As a result of this case study, the priority to fix the corresponded failure mode is depending on the level of applied stress. Once the key failure mode is fixed, the reliability of test item can be evaluated without re-testing, Furthermore, this approach will save the cost of design verification and man-hours in product development. |
本系統中英文摘要資訊取自各篇刊載內容。