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題 名 | A Fabrication Process Variation Based Approach to Evaluate Design-for-Test Techniques=製程偏移對可測試性設計技術效能影響的評估 |
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作 者 | 陳逸任; 黃俊郎; | 書刊名 | 國立臺灣大學工程學刊 |
卷 期 | 93 民94.02 |
頁 次 | 頁63-70 |
分類號 | 448.532 |
關鍵詞 | 可測試性設計; 混合信號電路測試; 類比轉換器; 數位轉換器; 積分非線性錯誤; 微分非線性錯誤; Design-for-test; Mixed-signal testing; Analog-to-digital converter; INL; DNL; |
語 文 | 英文(English) |
中文摘要 | 類比/混合信號系統的可測試性設計技術由於缺乏有效的評估方法,接受度一直不高。在這篇論文中,我們提出一個評估可測試性設計效能的技術。該方法考慮無可避免的製程偏移對待測電路與可測試性電路性能的影響,因此比過去的方法更為實際,也更能反映出實際生產線上的製程缺陷。我們以一個內含Ramp Generator可測試性設計的Flash ADC為例,分析的結果發現原來的可測試性設計並不能偵測到動態缺陷,必須重新設計Ramp Generator。 |
英文摘要 | One of the hurdles that prevent the wide acceptance of analog/mixed-signal design-for-test techniques is lack of a realistic and practical evaluation methodology. In this paper, a method to assess the quality of a design-for-test design (together with the associated test set) is proposed. Based on fabrication process variation information, our design-for-test evaluation criterion considers the inevitable adverse effects of fabrication process imperfection on both the functional and design-for-test circuits, and therefore will correlate better with the manufacturing test quality than past proposals. To validate our method, a flash ADC with a built-in ramp generator is used as an ex-ample. The proposed approach shows that the original design- for-test design fails capturing dynamic defects, and a redesign of the ramp generator or the test set is necessary to enhance the manufacturing test quality. |
本系統中英文摘要資訊取自各篇刊載內容。