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題 名 | Estimation of Optic Parameters from an Interference Figure=從干涉像量測光性參數 |
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作 者 | 蔡金郎; | 書刊名 | 中國地質學會會刊 |
卷 期 | 42:3 1999.08[民88.08] |
頁 次 | 頁477-492 |
分類號 | 349.38 |
關鍵詞 | 干涉像; 光率體; 折射率差; 光軸角; 多色性; Interference figure; Indicatrix; Birefringence; Optic angle; Pleochroism; |
語 文 | 英文(English) |
中文摘要 | 干涉像域之點與晶體中傳撥之波法線互為對應,而干涉像域中近乎直線的消光影 軌跡與光率體之主要面也互為對應關係。吾人可從干涉像中定位及辨識與主要軸和主要面對 應之點及軌跡,進而建立多色性及結晶特徵與光率體主要軸之關係。對已知厚度之礦物薄片 也從干涉像中量取三個主折射率差,進而估算光軸角。厚度之誤差所導致之折射率差誤差, 並不會傳輸至光軸角之測定。 |
英文摘要 | In an interference field, each point corresponds to a refracted wave normal , and a straight isogyre parallel to the vibration direction of the polarizer or analyzer, represents a principal section of an indicatrix. The principal axes and principal sections of an indicatrix can therefore be identified from and interference figure. The three principal birefringences of an indicatrix n –n , n –n , and n –n , can be estimated if the thickness of a mineral thin section is known. The method for estimating the three principal birefringences and the optic angle consists of (1) identifying the projected principal section and principal axes; (2) measuring the optic path differences; (3) determining the angle between refracted wave normals; (4) converting the optical path differences to the birefringences; (5) calculating the principal birefringences; (6) calculating optic angle. Errors in determining thin section thickness affect the estimates of birefringence but not the optic angle measurements. The variation of the pleochroism with the vibration directions of rays in a crystal can also be revealed by referring to an interference figure. |
本系統中英文摘要資訊取自各篇刊載內容。