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題名 | 顯微織構理論與背向散射電子繞射法在銲接冶金研究上的應用= |
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作者 | 陳志鵬; 周正裕; 何扭今; |
期刊 | 銲接與切割 |
出版日期 | 19990500 |
卷期 | 9:3 1999.05[民88.05] |
頁次 | 頁46-51 |
分類號 | 472.14 |
語文 | chi |
關鍵詞 | 銲接冶金; 背向散射電子繞射法; 顯微織構; 晶向映像; Welding metallurgy; Electron backscatter diffraction; EBSD; Microtexture; Crystal orientation mapping; COM; |
中文摘要 | 本文旨在介紹背向散射電子繞射法(EBSD)在銲接冶金研究上的應用。此種附加於 掃瞄式電子顯微鏡(SEM)上的裝置,在觀察銲道顯微組織的同時,又可經由背向散射電子繞 射所形成的高角度菊池譜,來鑑定其相關的結晶學訊息,如相鑑定、晶粒成長優選方向、 晶向關係以及晶格吻合度等。不但簡化過去材料研究上必須由X光繞射與各型顯微鏡分開實 驗的繁瑣步驟,又可彌補上述兩項實驗在試片取樣上的缺點。研究過程中,首先回顧傳統 織構理論,比較各式顯微分析儀器的特性,並舉沃斯田鐵系與雙相不�袗�雷射與電子束銲 件為實例,觀察銲道中的顯微組織,再經由晶向映像與顯微織構分析來建立銲接冶金的顯 微織構研究方法論。 |
英文摘要 | The applications of electron backscatter diffraction (EBSD) in welding metallurgy are briefly described, By indexing the backscattered high angle Kikuchi patterns, crystallographic informations, e.g. phase identification, preferred orientation, orientation relationships, even coincidence site lattice can be promptly obtained on a SEM based EBSD system. No tedious procedures in specimen preparation are required, Separate characterizations of materiais by X-ray diffraction and microscopy will be simplified and linked. Theory of texture associated with some microtextures determination of HEDW stainiess steel welds using EBSD are reviewed, Hopefully, the methodology of EBSD in welding metallurgy is thus to be established. |
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