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題 名 | 應用超音波量測薄層系統的材料常數=Measuring Material Constants of Thin Layered Media by Using the Ultrasonic Method |
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作 者 | 馬劍清; 留志宏; | 書刊名 | 國立臺灣大學工程學刊 |
卷 期 | 74 1998.10[民87.10] |
頁 次 | 頁111-137 |
分類號 | 440.12 |
關鍵詞 | 超音波檢測; 振幅頻譜; 材料常數; 波速; 薄板層; Ultrasonic testing; Amplitude frequency spectrum; Material constants; Wave velocity; Thin layer; |
語 文 | 中文(Chinese) |
中文摘要 | 材料常數一向是結構件的最基本性質,它在許多的工程分析及設計上有重要 的地位,材料常數除了可由傳統拉伸試驗中獲得,另外也能夠由縱波及橫波在材料中傳播波 速來求得,因此正確的蹤波及橫波波速量測十分重要而薄層的材料常數測定亦很難由拉伸試 驗來完成。本文提出以振幅頻譜法量測薄層材料系統的縱波及橫波波速,可以獲得由拉伸試 驗難以量測的薄層材料常數。本文中進行了許多實驗的量測都有相當好的結果,證實了所用 方法的正確性及適當性,此外, 振幅頻譜法也可以用來量電鍍薄層的厚度或材料常數。 |
英文摘要 | It is very important to have the correct material constants in many engineering appliciations and designs. The material constants can be obtained from measuring the wave velocities of longitudinal and shear waves, which is easier than that obtained from the coventional tensile testing. However it is very difficult to measure the material constants of thin layered material from the tensile testing method. Hence many efforts have been devoted in recent year for the development of measuring technique to get the accurate wave velocity. In this study, an amplitude spectrum technique for the measurement of the phase velocities of waves in thin layer media has been proposed and discussed in detail. A lot of experimental measurements for thin layered systems have been performed and very satisfactory results are obained which indicates the validity and accuracy of this method. This technique can also be used to measure the thickness or the wave velocities of electro-deposited coating material. |
本系統中英文摘要資訊取自各篇刊載內容。