查詢結果分析
來源資料
相關文獻
- 銅薄膜應力量測
- 磷酸結合包埋材的晶相轉變
- Dynamical Theory of X-ray Diffraction--A Review
- XRD Analysis of PZT Thin Films on Si Substrates by Rapid Thermal Annealing Processes
- 生化大分子晶體X光繞射儀的原理與應用
- Characteristics of C-axis Oriented AlN Films Grown by Reactive DC Magnetron Sputtering
- A Novel Method of X-Ray Diffraction to Analyze Paritally Nitrided Titanium Pellet
- Macro-and Microtexture Determinations of a Solution-treated 2205 Duplex Stainless Steel
- 研究二十二烷酸銀作為X光粉末繞射低角度準直繞射儀的參考標準
- 高溫超導體Bi2212系中Cu濃度對Tc影響之研究