頁籤選單縮合
題 名 | 點檢誤差對計數抽樣計劃影響之研究 |
---|---|
作 者 | 曾秀美; | 書刊名 | 技術學刊 |
卷 期 | 5:3 1990.09[民79.09] |
頁 次 | 頁299-307 |
分類號 | 494.568 |
關鍵詞 | 抽樣; 計劃; 計數; 誤差; 點檢; |
語 文 | 中文(Chinese) |
中文摘要 | 本文之目的在於探討點檢誤是對計數值抽樣計劃之不良影響。首先介紹點檢誤差之數學模式,根據抽樣計劃之基本理論以操作特性曲線(OC curve)、平均出廠品質(AOQ)及平均總檢查件數(ATI)分別討論點檢誤差對計數值單次抽樣計劃及雙次抽樣計劃的重大影響,並以合格線與不合格線之變化,說明點檢誤差對逐次抽樣計劃之影響。 |
英文摘要 | The purpose of this paper is to investigate the effects of inspection errors on the attribute sampling plan. First, the mathematical model of inspection errors is introduced in this study. Based on the definitions of OC curve, average outgoing quality, average totalinspection, the effects of inspect-tion errors on the attribute single sampling plan, the attribute double sampling plan, and the sequential sampling plan are studied. Finally, three examples are used illustrate the adverse effects of inspection errors on the attribute sampling plan. |
本系統中英文摘要資訊取自各篇刊載內容。