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題名 | 高解析度銻化銦紅外線偵檢模組技術=High Resolution InSb MWIR Detector Modules Technology |
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作 者 | 黃承生; 張倍榕; 古建德; 高耀堂; 翁炳國; | 書刊名 | 新新季刊 |
卷期 | 42:1 2014.01[民103.01] |
頁次 | 頁163-169 |
分類號 | 448.59 |
關鍵詞 | 銻化銦; 焦平面陣列; 紅外線偵檢器; InSb; Focal plane array; Infrared detector; |
語文 | 中文(Chinese) |
中文摘要 | 焦平面陣列偵檢模組(Focal Plane Array, FPA)是目前紅外線偵檢器發展的主流,光壓型(Photovoltaic)銻化銦檢知器,屬高量子效率之窄能隙半導體元件,其反應波長為3~5微米,正好是大氣主要的穿透窗之一,應用在軍事用途上非常理想(可降低大氣對紅外線傳遞的干擾),目前國外只有少數國家可以製作及生產,外購有嚴格輸出許可限制,價格昂貴且獲得困難。目前本院紅外線偵檢器陣列大小已由320×256像素30微米間距,精進至640×512像素15微米間距,此製程之精進可在不更換原有其他組件(如保溫瓶、致冷器、光學系統等),直接提升紅外線偵檢器解析度及靈敏度,以最少成本完成紅外線偵檢器的性能提升。本院研製成功的640×512像素15微米間距紅外線偵檢模組經影像測試,顯像品質良好,量測數據顯示其具備高操作率及好的均勻度,品質與先進國家相當,本技術獲得成功並規劃應用在國軍下一代熱像觀測系統。 |
英文摘要 | When it refers to infrared detector technology, Focal Plane Array (FPA) detectors have become the mainstream of development in these years. Among all kinds of infrared detectors, photovoltaic InSb device possesses two optoelectronic characteristics including high quantum efficiency and narrow band gap. Furthermore, it should be noticed that reaction wavelength of InSb photovoltaic detector locates in 3~5 micrometer, where infrared radiation suffer less interference in atmosphere. The performance makes InSb FPA detectors widely adopted in military development. Till now, only a few countries can develop and manufacture InSb FPA, which is limited by purchase because of expensive price and difficult acquisition. At present, CSIST have developed the IR FPA array size from 320×256 pixels 30 micron pitch sophistication to 640×512 pixels 15 micron pitch. The merit of this process lies in that it increases the resolution and sensitivity of IR detector with minimal cost, without replacement of original components. CSIST successfully develop 640×512 pixels 15 micron pitch IR detector, which possesses image with high quality. The measurement results imply that the FPAs developed in CSIST can provide both high operability and uniformity comparing to products, which are made from other countries with advanced thermal imaging sensing methods. This successful technology is planned to apply to the production of next generation thermal image detector. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。