頁籤選單縮合
題名 | A Greedy Approach to Test Construction Problems=利用貪婪技術於測驗建構問題之研究 |
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作者 | 孫光天; Sun, Koun-tem; |
期刊 | Proceedings of the National Science Council : Part D, Mathematics, Science, and Technology Education |
出版日期 | 200105 |
卷期 | 11:2 2001.05[民90.05] |
頁次 | 頁78-87 |
分類號 | 521.3 |
語文 | eng |
關鍵詞 | 貪婪技術; 測驗; Item response theory; Test construction; Combinatiorial optimization problem; Educational Measurement; |