查詢結果分析
來源資料
相關文獻
- 從統計製程管制邁向六個標準差--液晶顯示器業個案研究
- Confidence Intervals for Multivariate Process Capability Indices Using Bootstrap
- 製程間具相關數據之趨勢模型偵測探討
- Distributional Property of the Incapability Index C抅抅 Under Edgeworth Series Distribution for Processes with Symmetric Tolerances
- An Integrated Approach to Semiconductor Equipment Monitoring
- 軟體品質保證系統:架構與個案之探討
- A Study on the Process Capability Index Cp for Correlated Data
- Asymptotic Distribution for Estimator of Process Incapability Index C"pp for Second Order Stationary Processes
- 類神經網路於製程管制之應用:具相關性數據特性模型之偵測與分析
- Apply a General Percentile Method to Evaluate Process Capability Indices