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題 名 | 分析式電子顯微鏡(2)--成份分析=The Function and Application of Analytical Electron Microscopy(Ⅱ)--Chemical Analysis |
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作 者 | 張六文; 陳煌湶; | 書刊名 | 技術與訓練 |
卷 期 | 23:1=188 1998.02[民87.02] |
頁 次 | 頁31-46 |
專 輯 | 材料分析儀器專集 |
分類號 | 471.713 |
關鍵詞 | 分析式電子顯微鏡; Analytical electron microscopy; Energy dispersive X-ray spectrometer; Electron energy loss spectrometer; Chemical analysis; |
語 文 | 中文(Chinese) |
中文摘要 | 分析式電子顯微鏡主要是利用能量分散 X 光能譜儀和電子能耗能譜儀進行成份 分析。前者操作簡易,可迅速得到試片內微小區域內的化學成份資訊。後者操作程序雖較繁 複,但可彌補前者對輕元素分析能力不足的缺點,此外,由電子能耗能譜亦可窺知元素的鍵 結狀態,並可準確量測試片厚度,對提昇化學分析的精度和準度都有很大的助益。 |
英文摘要 | energy dlispersive X-ray spectrometer (EDS) and electron energy loss spectrometer (EELS) are the major instruments employed to execute chemical analysis in analytical electron micoscope. The former is easy to operate. Chemical composition within a small region can be detected without difficulty. Furthermore, the EELS is more sensitive to light elements, such as boron, corbon, nitrogen and oxygen, and to chemical bonding status of each element. Proper employment of both instruments can thus turn the analytical electron microscope into a very powerful tool in mateial characterization. |
本系統中英文摘要資訊取自各篇刊載內容。