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題名 | Defect Inspection and Analysis of Color Filter Panel= |
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作者 | 吳木杏; 傅楸善; 陳賢義; Wu, Mu-hsing; Fuh, Chiou-shann; Chen, Hsien-yei; |
期刊 | 影像與識別 |
出版日期 | 20000600 |
卷期 | 6:2 2000.06[民89.06] |
頁次 | 頁74-90 |
分類號 | 448.6 |
語文 | eng |
關鍵詞 | 彩色濾光片; 工業檢測; Color filter; Defect inspection; |
英文摘要 | In this paper, an experimental automatic color filter surface defect inspection system isdescribed. It is based on the image subtraction method for the purpose of high-speedinspection. The experimental result shows that our algorithm achieves high accuracy andhigh speed for industrial requirement. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。