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題 名 | 次空間投影法在未知環境中對特定化學物質偵檢之應用=Subspace Projection Approach for Specific Chemical Material Detection in Unknown Environment |
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作 者 | 杜德銘; 李靖海; 徐學群; 李震東; 何文宣; 張劍平; | 書刊名 | 技術學刊 |
卷 期 | 15:3 2000.09[民89.09] |
頁 次 | 頁413-422 |
分類號 | 595.83 |
關鍵詞 | 正交次空間投影法; 雜訊次空間投影法; 紐曼皮耳森偵測理論; Orthogonal subspace projection; OSP; Noise subspace projection; NSP; Neyman-pearson detection theory; |
語 文 | 中文(Chinese) |
中文摘要 | 本文旨在利用陣列訊號處理技術來偵檢未知環境中的特定化學物質及其濃度之分析。基本上陣列訊號處理的技術與傅氏轉換紅外線光譜儀的訊號模式是相當契合的,若已將欲分析的特定化學物質圖譜建立完整,則可配合光譜訊號特性建立一個新型的次空間投影方法,其分析之速度與精確度均可優於傳統的方法。文中首先探討在「背景已知」的條件下,如何利用正交次空間投影法進行特定化學物質之分析,並依據其理論進一步進行在「背景未知」之環境下,以雜訊次空間投影法進行上述的工作。由實驗結果顯示,這兩種方法的準確度相當近似。相較之下,由於雜訊次空間投影法可在未知環境中偵檢特定化學物質並同時進行度分析,故為一個良好的偵測機制。 |
英文摘要 | In this work, the array signal processing technique is adopted to detect a specific chemical material and perform concentration analysis against an unknown background. The primary reason for using this technique is that it best fit the signal model of the Fourier transform infrared spectrometry (FTIR). When the standard spectral signatures of chemical materials are obtained, the subspace projection method can be modified to detect a specific chemical material against an unknown background. The orthogonal subspace projection (OSP) method is applied herein to resolve the detection problem for "target against a known priori background," and the noise subspace projection (NSP) method is then used to resolve the more complex problem for "target against unknown background." From the experimental results for the NSP versus the OSP, we find that they provide very similar results. Therefore the NSP is a highly efficient method for detecting specific chemical material and analyzing its concentration against an unknown background. |
本系統中英文摘要資訊取自各篇刊載內容。