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題名 | 雙水層水井特性之研究=Study on Two-layer Aquifer Well Characteristic |
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作 者 | 陳健夫; | 書刊名 | 農業工程學報 |
卷期 | 46:3 2000.09[民89.09] |
頁次 | 頁83-93 |
分類號 | 443.56 |
關鍵詞 | 水井; 地下水; 複水層; 單位洩降出水量; Water well; Groundwater; Multi-aquifer; Specific capacity; |
語文 | 中文(Chinese) |
中文摘要 | 雙水層水井為一井孔穿鑿兩含水層之綜合水井結構體,每一含水層有其獨立之水文、水力特性,在水井中形成一綜合水位,根據水層流量與水位之平衡關係,個別水層水位與綜合水位之距離,與其單位洩降出水量成反比。雙水層水井之單位洩降出水量,除受水位之升降、抽水時間、出水量及臨井干擾等一般單水層水井之因素外,另受兩水層間之水文及水力特性差異之影響。雙水層水井為複水層水井之基本型態,在水層屬性方面,可概分為上非受壓下受壓水層,及兩受壓水層等兩種。在水層優劣方面,可區分為上優下劣、上劣下優及上下相當等三種。在水文方面,可能出現的情況為,上水層水位高下水層水位低,及上水層水位低下水層水位高等兩種型態。每一種水層屬性、水文狀態及水力組合,皆有其不同之出水特性。 雙水層水井水層間存在之勢能差異,可造成水層間地下水質快速之污染,並使以微流速儀測定個別水層出水百分率,受抽水量之大小而變動。此外,以抽水方式採集地下水水樣者,所得之綜合水樣亦受抽水量大小之影響。而以採樣器伸入井內方式取樣者,可因取樣位置之不同而發生差異。 |
英文摘要 | A two-layer aquifer well is defined as a combined well penetrating two aquifers. Each aquifer owns its independent formation characteristic and potential. According to well hydraulics, the water flows from higher potential aquifer into a lower one, and a combined water level will be formed between them. The distance from individual water level to combined water level is inverse ratio to its specific capacity. In addition to water level variation, pumping time, discharge and well interference, the specific capacity of two-layer aquifer well is affected by potential difference and formation hydraulics characteristics. The potential difference also result groundwater pollution between aquifers. Besides, it will change flow percentage of aquifer by taking different pumping rate. Both taking water sample from a pump or water sampler in a two-layer aquifer well is more complex than that in single layer water well. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。