頁籤選單縮合
題 名 | A Class of Nonparametric K-Sample Tests for Semi-Markov Counting Processes |
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作 者 | Chang,I-shou; Chuang,Yuan-chuan; Hsiung,Chao A.; | 書刊名 | Statistica Sinica |
卷 期 | 9:1 1999.01[民88.01] |
頁 次 | 頁211-227 |
分類號 | 319.5 |
關鍵詞 | Asymptotic distribution; Asymptotic efficiency; K-sample test; Parametric submodel; Semi-markov counting process; |
語 文 | 英文(English) |
英文摘要 | A K-sample testing problem is studied for multivariate semi-markov counting processes. Asymptotic distributions and efficiency of a class of nonparametric test statistics are established for certain local alternatives. The concept of the asymptotic efficiency states that for every nonparametric test in this class, there is a parametric submodel for which the optimal test has the same asymptotic power as the nonparametric test. The theory is illustrated by a simulation study and by analyzing the multivariate failure time data of Thompson et al. (1978). |
本系統中英文摘要資訊取自各篇刊載內容。