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題名 | 肥粒鐵基球墨鑄鐵共晶包界之電解腐蝕分析=Analysis of Eutectic Cell Wall of Ferritic Ductile Cast Iron by Electrochemical Etching |
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作者 | 蕭富昌; 呂傳盛; 陳立輝; Shiao, F. T.; Lui, T. S.; Chen, L. H.; |
期刊 | 鑄工 |
出版日期 | 19970600 |
卷期 | 23:2=93 1997.06[民86.06] |
頁次 | 頁82-88 |
分類號 | 472.3 |
語文 | chi |
關鍵詞 | 肥粒鐵基球墨鑄鐵; 共晶包界; 電解腐蝕; |
中文摘要 | 肥粒鐵基球墨鑄鐵之共晶包界分布型態因化學組成及凝固速率之不同而不同。本 實驗選用不同矽含量之肥粒鐵基球墨鑄鐵為試料,並改變凝固速率,探討以電解腐蝕方式揭 露共晶包界之分布型態。 實驗結果顯示,共晶包界在 Morries 溶液以 5V 之電壓進行電解 腐蝕,可充分將共晶包界揭露。根據此電解腐蝕結果,較高矽含量以及較慢的凝固速率之試 料,共晶包界之腐蝕區域較大,而共晶包界內聚集之氧化鎂領粒以及偏析元素較密集。 |
英文摘要 | The eutectic cell walls of ferritic spheroidal graphite (SG) cast irons are varied with their chemical composition and solidiification rate. To reveal the morphologies and distributions of eutectic cell walls, the method of electrochemical etching was studied. Four ferritic Sg cast irons with different silicon contents and solidification rates were used to conduct electrochemical etching in the Morries solution. The results show that the area of the eutectic cell wall is lareger and the inclusions and impurities segreated at the cell wall are denser for higher silicon content materials. |
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