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題名 | Does There Exist a Combinational TSC Checker for 1/3 Code Using Only Primitive Gates |
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作者姓名(中文) | 張文峰; 吳誠文; | 書刊名 | Journal of Information Science and Engineering |
卷期 | 13:4 1997.12[民86.12] |
頁次 | 頁681-695 |
分類號 | 310.15 |
關鍵詞 | Concurrent error detection; Digital testing; m-out-of-n code; 1 out-of-3 code; Single stuck-at fault; Totally self-checking checker; |
語文 | 英文(English) |
英文摘要 | The answer is "no." For gate-level circuits and single stuck-at faults, it has been shown that all m/n-code TSC checkers can be successfully designed, except one for 1/3 code. Although many researchers believe such a checker does not exist, none has proved that this is the case, which makes the problem open. In this paper, we shown that no such checker exists using only AND, OR, and NOT gates (and, therefore, NAND and NOR gates). We solve this problem by giving a strict and clear proof. We also can deduce from our proof that no such TSC checker exists for any code which has only three code words. |
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