頁籤選單縮合
題 名 | A Study of Computer-Aided Test (CAT) in VLSI Fabrication Process |
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作 者 | 沈榮麟; | 書刊名 | 明志工專學報 |
卷 期 | 15 1983.06[民72.06] |
頁 次 | 頁61-141 |
分類號 | 448.945 |
關鍵詞 | |
語 文 | 英文(English) |
英文摘要 | This paper presents the author’s opinion of the major problem confronting test automation (TA) for VLSI (Very-Large-Scale Integrated) devices and how TA may evolve to meet these challenges. The paper first takes a look at the related information about TA; then, develops a method of computer-aided test (CAT) with the structured design, and discusses testing applications. Emphasis is given to final test. Designers who use the computer-aided design (CAD) program for VLST circuits need an inexpensive and speedy way to test the correctness of these designs. Thus, the author examines methods and equipment needed to test complex VLST devices, and delves into the functional test vectors portion of the electrical test specification and the design-for-testability issues. He shows a flexible approach to CAT with the structured design guided by the concept. The method described addresses the following objectives: proper selection of Automatic Test Equipment (ATE), shortened test development time, working functional patterns prior to first wafers manufactured, proper use of accelerated testing fault coverage analysis, high level functional test language, enhanced test pattern debugging aids, and advantages of the structured design. |
本系統中英文摘要資訊取自各篇刊載內容。