頁籤選單縮合
題名 | Multi-scan Architecture with Scan Chain Disabling Technique for Capture Power Reduction |
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作者姓名(中文) | 殷仁政; 曾王道; 蔡文錦; | 書刊名 | Journal of Information Science and Engineering |
卷期 | 35:4 2019.07[民108.07] |
頁次 | 頁839-849 |
分類號 | 448.945 |
關鍵詞 | Capture power; Low power testing; Power consumption; Scan-based testing; Scan chain; |
語文 | 英文(English) |