頁籤選單縮合
題名 | Shapiro Steps Observed in a Superconducting Single Electron Transistor= |
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作者 | Liou, Saxon; Kuo, Watson; Suen, Y. W.; Hsieh, W. H.; Wu, C. S.; Chen, C. D.; |
期刊 | Chinese Journal of Physics |
出版日期 | 20070400 |
卷期 | 45:2(2) 2007.04[民96.04] |
頁次 | 頁230-236 |
分類號 | 337.472 |
語文 | eng |
關鍵詞 | |
英文摘要 | The dc current-voltage (IV) characteristics of a superconducting single electron transistor irradiated with microwaves up to 18 GHz are experimentally studied. The switching current as a function of gate voltage demonstrates clear phase-charge duality in a Josephson junction. At higher microwave power levels, Shapiro steps in IV characteristics are observed. The step height in IV can be analyzed using the model an ac-voltage source applied to a single Josephson junction. |
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