頁籤選單縮合
| 題 名 | Shapiro Steps Observed in a Superconducting Single Electron Transistor |
|---|---|
| 作 者 | Liou, Saxon; Kuo, Watson; Suen, Y. W.; Hsieh, W. H.; Wu, C. S.; Chen, C. D.; | 書刊名 | Chinese Journal of Physics |
| 卷 期 | 45:2(2) 2007.04[民96.04] |
| 頁 次 | 頁230-236 |
| 分類號 | 337.472 |
| 關鍵詞 | |
| 語 文 | 英文(English) |
| 英文摘要 | The dc current-voltage (IV) characteristics of a superconducting single electron transistor irradiated with microwaves up to 18 GHz are experimentally studied. The switching current as a function of gate voltage demonstrates clear phase-charge duality in a Josephson junction. At higher microwave power levels, Shapiro steps in IV characteristics are observed. The step height in IV can be analyzed using the model an ac-voltage source applied to a single Josephson junction. |
本系統中英文摘要資訊取自各篇刊載內容。