頁籤選單縮合
題 名 | High-Speed Transition Detecting Circuits for On-Chip Interconnections |
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作 者 | Huang, Hong-yi; Chen, Shih-lun; | 書刊名 | 淡江理工學刊 |
卷 期 | 9:1 民95.03 |
頁 次 | 頁37-44 |
分類號 | 448.5 |
關鍵詞 | High-speed; Interconnections; Receivers; Deep sub-micron; Transition detection; |
語 文 | 英文(English) |
英文摘要 | A transient sensitive trigger (TST) was used to reduce the RC delay time for the long intercomention in deep sub-micron (DSM) processes. The conventional TST circuit exhibits a voltage drop in threshold voltage during transitions, extending the delay time. This paper proposes new circuits called transition detecting circuits (TDCs) to overcome the drawbacks of the conventional TST. The proposed circuits yield 45-74% shorter delay time than the conventional TST simulation using a 0.25 μm CMOS process. The experiment results also show that the proposed TDSs are faster than the conventional TST. The proposed circuits can be applied to receiving long interconnect signals in high-sped VLSI design. |
本系統中英文摘要資訊取自各篇刊載內容。