頁籤選單縮合
題名 | A New Cluster Validity Measure Based on the Concept of Line Symmetry |
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作者 | Su, Mu-chun; Hsieh, Yi-zeng; Chou, Chien-hsing; Chien, Yi-hsiang; | 書刊名 | Journal of Science and Innovation |
卷期 | 2:2 2012.04[民101.04] |
頁次 | 頁61-66 |
分類號 | 310.1 |
關鍵詞 | Cluster validity; Clustering algorithm; Line symmetry; Cluster analysis; Similarity measure; |
語文 | 英文(English) |