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題 名 | 利用雷射測微計評估木材表面粗糙度之研究=Study on Evaluating Wood Surface Roughness with Laser Micrometer |
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作 者 | 黃國雄; 藤原裕子; 奧村正悟; | 書刊名 | 林產工業 |
卷 期 | 21:2 2002.06[民91.06] |
頁 次 | 頁97-105 |
分類號 | 436.181 |
關鍵詞 | 木材; 表面粗糙度; 取樣間隔; 雷射測微計; 觸針式表面粗糙度測定儀; Wood; Surface roughness; Sampling interval; Laser micrometer; Stylus surface roughness instrument; |
語 文 | 中文(Chinese) |
中文摘要 | 本研究旨在探討雷射變位計評估木材表面粗糙度之可行性,試驗材料包括台灣杉、扁拍、泡桐、櫸木與毛柿等五種氣乾材,試驗中測定中心線平均租糙度(Ra)、最大高度(Ry)、十點平均組糙度(Rz)、凹凸平均間隔(Sm)與局部山頂平均間隔(S)等五種粗糙度參數,首先比較雷射變位計所測定之木材粗糙度參數與觸針式表面粗糙度測定儀者之差異,再檢討雷射變位計之取樣間隔對粗糙度參數之影響。由雷射變位計與觸針式表面租糙度測定儀進行表面租糙度之試驗結果得知五種試材使用雷射變位計所測得之Ra、Ry與Rz等三種粗糙度參數均較觸針式表面粗糙度測定儀者大,同一參數兩測定法之比值,因樹種而不同,針葉樹之台灣杉與扁柏中,其比值之差異較闊葉樹之泡桐、樺木與毛柿者明顯。除了扁柏之外,雷射變位計所測得之Sm與S等兩種粗糙度參數均較觸針式表面粗糙度測定儀者小。由雷射變位計在不同之取樣間隔測定木材表面祖糙度之試驗結果得知Ra、Ry與Rz等三參數隨取樣間隔之增加而減小,而Sm與S等二參數則反之。 |
英文摘要 | The purpose of this study was to investigate the feasibility of using laser micrometer in measuring surface roughness of wood. Test specimens included air-dried woods of Taiwania cryptomerioides, Chamaecyparisobtusa var. formosana, Paulownia X taiwaniana, Zelkova serrata and Diospyros discolor. The surface roughness parameters of arithmetical mean deviation of the profile (Ra), maximum height of the profile (Ry), ten point height of irregularities (Rz), mean spacing of the profile irregularities (Sm), and mean spacing of local peak of the profile (S) were measured. The differences in roughness parameters of wood between laser micrometer and stylus surface roughness instrument methods were compared. Then, the effects of sampling interval of laser micrometer test on roughness parameters were examined. For all of the woods, Ra, Ry and Rz measured by laser micrometer were larger than those by stylus instrument. The differences in the parameter ratios of the two methods for Taiwania cryptomerioides and Chamaecyparis obtusa were more significant than those of Paulownia taiwaniana, Zelkova serrata, and Diospyrosdiscolor. Except for Chamaecyparis obtusa, Sm and S measured by laser micrometer were smaller than those by stylus instrument. In measuring of the surface roughness, laser micrometer had the lower Ra, Ry and Rz values with a greater sampling interval, but the reverse was true for Sm and S. |
本系統中英文摘要資訊取自各篇刊載內容。