頁籤選單縮合
題名 | Characteristics of Nanoscale Silicon with Crack under Uniaxial Tensions Using Molecular Dynamics= |
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作者 | 方得華; 盧燈茂; 蔡松霖; Fang, Te-hua; Lu, Deng-maw; Tsai, Sung-lin; |
期刊 | 南臺科技大學學報 |
出版日期 | 20041200 |
卷期 | 29 2004.12[民93.12] |
頁次 | 頁35-44 |
分類號 | 440.34 |
語文 | eng |
關鍵詞 | Molecular dynamics; Silicon; Crack; Young's modulus; |
英文摘要 | The characteristics of monocrystallinc silicon with tcnsilc crack fractures under uniaxial tension are quantified by molecular dynamics (MD) simulation. A general form of Tcrsoff-typc three-body potential was used for the interaction between the Si atoms in the simulations. The results showed that as the strain increased the stress also increased, up to the ultimate tensile strength, then the necking phenomenon and slip mechanism caused the specimen to fracture. Young's modulus of Si in the [100] direction was determined to be 112.4GPa and the ultimate tensile strength was about 15-20 GPa. The results showed that the larger the radius of the initial crack the lower the ultimate tensile strength became. |
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