頁籤選單縮合
題 名 | Cumulative Sum Charts for High Yield Processes |
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作 者 | Chang,T. C.; Gan,F. F.; | 書刊名 | Statistica Sinica |
卷 期 | 11:3 2001.07[民90.07] |
頁 次 | 頁791-805 |
分類號 | 319.5 |
關鍵詞 | Bernoulli counts; Geometric counts; Markov chain; Parts-per-million; Statistical process control; |
語 文 | 英文(English) |
英文摘要 | The cumulative sum (CUSUM) chart, well-known to be sensitive in detecting small and moderate parameter changes, is proposed her for monitoring a high yield process. The sensitivities of the CUSM charts based on geometric, Bernoulli and binomial counts are compared. Based on the comparisons, recommendations for the selection of a chart are provided. Simple procedures are given for optimal design of CUSUM charts based on geometric and Bernoulli counts. An application of CUSUM charts in monitoring an actual high yield process is demonstrated. |
本系統中英文摘要資訊取自各篇刊載內容。