頁籤選單縮合
題 名 | Maximization of Power Dissipation Under Random Excitation for Burn-In Testing=熱加速測試之隨機輸入圖樣的功率消耗最大化 |
---|---|
作 者 | 黃國展; 李崇仁; 陳竹一; | 書刊名 | Journal of the Chinese Institute of Electrical Engineering |
卷 期 | 6:2 1999.05[民88.05] |
頁 次 | 頁125-149 |
分類號 | 448.537 |
關鍵詞 | 熱加速測試; 功率消耗最大化; 功率消耗估算; 加權隨機輸入圖樣; Power dissipation maximization; Power dissipation estimation random pattern and burn-in testing; |
語 文 | 英文(English) |
中文摘要 | 本研究提出一加權隨機輸入圖樣的產生方法,其所產生的隨機圖樣能使得電路在 熱加速測試期間的功率消耗達到最大值。此方法利用一機率模型與一最大化程序來獲得電路 輸入端的信號變化機率分佈,並且根據此信號變化機率分佈來產生加權隨機輸入圖樣。更特 別的是此方法所產生的加權隨機輸入圖樣能夠驅動電路中一些特定選擇的缺陷節點,進而促 使這些缺陷節點的早期失敗發生以提高產品的可靠度。實驗結果顯示此方法可以增加整個電 路26.68%的功率消耗,對於一些特定選擇節點則有高達41.51%增加。 |
英文摘要 | This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model and maximization procedure to obtain signal transition probability distribution for primary inputs and to generate weighted random patterns according to the obtained probability distribution. It can especially generate weighted random patterns to excite particularly selected "weak nodes" of the circuit in order to expose early failure in these nodes. Experimental results show that this approach can increase switchings of the total circuit nodes up to 26.68% and of particularly selected nodes up to 41.51% respectively. |
本系統中英文摘要資訊取自各篇刊載內容。