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題名 | 分析式電子顯微鏡(1)--成像原理與繞射分析=The Function and Appilication of Aralytical Electron Microscopy(Ⅰ)--Image Formation and Diffraction Analysis |
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作者 | 陳煌湶; 張六文; Chen, Huang-chuan; Chang, Liuwen; |
期刊 | 技術與訓練 |
出版日期 | 19980200 |
卷期 | 23:1=188 1998.02[民87.02] |
頁次 | 頁13-30 |
分類號 | 471.713 |
語文 | chi |
關鍵詞 | 穿透式電子顯微鏡; 能量分散能譜儀; 電子能耗能譜儀; 分析式電子顯微鏡; Transmission electron microscope; X-ray energy dispersive spectrometor; Electron energy lose spectroscope; Analytical electron microscope; |
中文摘要 | 穿透式電子顯微鏡(TEM)可用來觀察材料內部顯微組織並可分析其晶體結構。 若加裝 X-ray 能量分散能譜儀( EDS ),則可分析材料內部微區成份,若加裝電子能耗能 譜儀( EELS ),則除可較準確分析出 B.C.N.O. 等輕元素外,更可分析原子的化學鍵結狀 態,為材料研究不可或缺之工具。 本公司擁用一剖份 100KV 之 TEM 及一部 200KV 之 AEM ( Analytical Electron Microscope, TEM + EDS + EELS ),本文對穿透式電子顯微鏡 主體之原理及功能做簡介外,並列舉其在鋼鐵研發上之應用實例。 |
英文摘要 | Transmission electron microscope (TEM) is usually used to examine the microstructure and crystal structure of the material. If X-ray energy dispersive spectrometor (EDS) is installed, the chemical composition of local area can be analyzed. Furthermore, if electron energy lose spectroscope (EELS) is installed, light elements such as boron, nitrogen, carbon and oxygen can be easily detected Besides, chemical bonding structure of the atom can also be determined. There are two sets of transmission electron microscopes in CSC. The accelerating voltage is 100KV and 200KV respectively. The later one is an analytical type with TEM + EDS + EELS. The priciple and function of the transmission electron microscope were described. Some application examples were introduced. |
本系統之摘要資訊系依該期刊論文摘要之資訊為主。