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頁籤選單縮合
題名 | 聚焦離子束斷層掃描分析技術介紹=Introduction to Focused Ion Beam Tomography |
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作者 | 賴明偉; 羅聖全; 林麗娟; Lai, M. W.; Lo, S. C.; Lin, L. J.; |
期刊 | 工業材料 |
出版日期 | 20100100 |
卷期 | 277 2010.01[民99.01] |
頁次 | 頁48-56 |
分類號 | 440.2 |
語文 | chi |
關鍵詞 | 聚焦離子束; 斷層掃描; 三維重建; Focused ion beam; FIB; Tomography; Three-dimensional reconstruction; |