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題名 | The Design of Key Performance Indicators on Technology Development of a Wafer Foundry=晶圓代工廠中研發績效指標之設計 |
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作者 | 杜瑩美; 陳欣男; 張盛鴻; Tu, Ying-mei; , Hsin-nan; Chang, Sheng-hung; |
期刊 | 工業工程學刊 |
出版日期 | 20100900 |
卷期 | 27:5 2010.09[民99.09] |
頁次 | 頁351-362 |
分類號 | 488 |
語文 | eng |
關鍵詞 | 關鍵績效指標; 研發; 晶圓代工; X-因子; 生產週期時間; Key performance indicator; R&D; Wafer foundry; X-factor; Cycle time; |
英文摘要 | Due to capital intensive characteristics, R&D departments always share production equipment with manufacturing departments in the wafer foundry industry. The goal of key performance indicators (KPIs) among these two departments is contradictory, a situation that results in longer R&D cycle times and delays in time-to-market. To solve the problem, this study has adapted the concepts of X-factor theory to construct an R&D engineering lot management model. There are two KPIs adapted in this model. The first KPI, the X-factor, is applied to trace on-time delivery performance of the new R&D technology. The second KPI, F-factor, is regarded as an index that reflects the holding cost and manufacturability of R&D lots, and simultaneously evaluates the maturity of the technology. Furthermore, a set of real data from the Fab is applied to examine the effectiveness of this model. The results reveal that this model successfully improves operational performance and shortens the R&D cycle time, which ultimately enables a factory to achieve a global optimization. |
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